《粉末衍射数据阶段识别软件》(Crystal Impact Match)v1.9e含patch[压缩包]

《粉末衍射数据阶段识别软件》(Crystal Impact Match)v1.9e含patch[压缩包]
  • 片  名  《粉末衍射数据阶段识别软件》(Crystal Impact Match)v1.9e含patch[压缩包]
  • 简  介  发行时间: 2009年制作发行: Crystal Impact语言: 英文
  • 类  别  软件
  • 小  类  应用软件


  • 详细介绍中文名: 粉末衍射数据阶段识别软件英文名: Crystal Impact Match资源格式: 压缩包版本: v1.9e含patch发行时间: 2009年制作发行: Crystal Impact地区: 德国语言: 英文简介: 引用Installation:
    Unpack Install. Move patch.exe to installdir and use it. Also delete Onlineupdate.exe from intalldir (or block it from accessing network).
    软件类型:应用软件
    软件性质:免费破解软件
    操作系统:Windows
    应用平台:Microsoft Windows 98, ME, NT 4.0, 2000, XP or Vista operating system
    问题反馈: brandenburg@crystalimpact.de
    网站链接: http://www.crystalimpact.com/match/
    软件介绍:
    Crystal Impact Match是一款易用的粉末衍射数据阶段识别软件。通过把样本的粉末衍射形态与数据库中的参考形态进行比较,来确定样本所在阶段。通过提升ICSD(无机晶体结构数据库)的检索效率,提高参考模式数据库的价值。
    Match!
    Phase Identification from Powder Diffraction
    Match! is an easy-to-use software for phase identification from powder diffraction data, which has become a daily task in material scientists work. Match! compares the powder diffraction pattern of your sample to a database containing reference patterns in order to identify the phases which are present. Single as well as multiple phases can be identified based on both peak data and raw (profile) data.
    As reference database, you can apply the included free-of-charge IUCr/COD/AMCSD database and/or ICSD/Retrieve (if you have a valid licence), use any ICDD PDF product, and/or create a user database based on your own diffraction patterns. The user database patterns can be edited manually, imported from peak files, calculated from crystal structure data (e.g. CIF files), or imported from your colleague's user database.
    A list of Match!'s most prominent features can be found here.
    Match! Function List
    * Fast single and multiple phase identification from powder diffraction data
    * Use free-of-charge reference patterns calculated from the IUCr/ COD/AMCSD (incl. I/Ic), any ICSD/Retrieve version (released 1993-2002; valid licence required), any ICDD PDF database and/or your own diffraction data (or patterns calculated from crystal structure data (e.g. CIF files)) in phase identification
    * Flexible handling of reference databases (incl. user databases); you can easily switch between different reference databases without the necessity to perform a new database indexation
    * Create reference databases for neutron diffraction e.g. from cif-files
    * Comfortable user database manager for easy maintenance of user data (add/import/edit/delete/sort entries)
    * Powerful CIF- and ICSD/Retrieve import, incl. calculation of powder pattern, I/Ic and density
    * Atomic coordinates available e.g. in the ICSD, the ICDD PDF-4+ or free-of-charge reference data are displayed in the data sheets and included in the CIF exports (e.g. for Rietveld analysis)
    * View crystal structures in Diamond with just a few clicks
    * Fully integrated handling of your own diffraction data with PDF data (search-match, retrieval, data viewing)
    * Automatic residual searching with respect to identified phases
    * Automatic raw data processing: α2-stripping, background subtraction, peak search, profile fitting, error correction
    * Automatic optimization of peak searching sensitivity
    * Fitting of all (or selected) peak parameters to exp. profile data
    * Comfortable manual editing of peaks (add/shift/delete/fit) using mouse or keyboard
    * Semi-quantitative analysis (Reference Intensity Ratio method)
    * Straight-forward usage of additional knowledge (composition, PDF subfiles, crystallographic data, color, density etc.)
    * Integrated database retrieval system and viewer for PDF and user datasheets
    * Multiple step undo/redo
    * Support for new PDF entry numbers (9 digits)
    * Us
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